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Nanometer–scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)

by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

ISBN 13: 9781848219366

Format: Hardcover (316 pages)
Publisher: Wiley-ISTE
Published: 12 Aug 2016

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Infrared Spectroscopy of Symmetric and Spherical Spindles for Space Observation 1

by Pierre-Richard Dahoo,Azzedine Lakhlifi

ISBN 13: 9781786305688

Format: Hardcover (286 pages)
Publisher: Wiley-ISTE
Published: 12 Aug 2021

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